The IRMA Community
Newsletters
Research IRM
Click a keyword to search titles using our InfoSci-OnDemand powered search:
|
Dealing with Dangerous Data: Part-Whole Validation for Low Incident, High Risk Data
|
Author(s): Cecil Eng Huang Chua (Information Systems and Operations Management Department, University of Auckland, Auckland, New Zealand)and Veda C. Storey (Department of Computer Information Systems, J. Msck Robinson College of Business, Georgia State University, Atlanta, GA, USA)
Copyright: 2016
Volume: 27
Issue: 1
Pages: 29
Source title:
Journal of Database Management (JDM)
Editor(s)-in-Chief: Keng Siau (City University of Hong Kong, Hong Kong SAR)
DOI: 10.4018/JDM.2016010102
Purchase
|
Abstract
In certain situations, syntactically valid, but incorrect, data entered into a database can result in near-immediate, catastrophic financial losses for an organization. Examples include: omitting zeros in prices of goods on e-commerce sites; and financial fraud where data is directly entered into databases, bypassing application-level financial checks. Such “dangerous data” can, and should, be detected, because it deviates substantially from the statistical properties of existing data. Detection of this kind of problem requires comparing individual data items to a large amount of existing data in the database at run-time. Furthermore, the identification of errors is probabilistic, rather than deterministic, in nature. This research proposes part-whole validation as an approach to addressing the dangerous data situation. Part-whole validation addresses fundamental issues in database management, for example, integrity maintenance. Illustrative and representative examples are first defined, and analyzed. Then, an architecture for part-whole validation is presented and implemented in a prototype to illustrate the feasibility of the research.
Related Content
Pasi Raatikainen, Samuli Pekkola, Maria Mäkelä.
© 2024.
30 pages.
|
Zhongliang Li, Yaofeng Tu, Zongmin Ma.
© 2024.
25 pages.
|
Zongmin Ma, Daiyi Li, Jiawen Lu, Ruizhe Ma, Li Yan.
© 2024.
32 pages.
|
Lavlin Agrawal, Pavankumar Mulgund, Raj Sharman.
© 2024.
37 pages.
|
Jizi Li, Xiaodie Wang, Justin Z. Zhang, Longyu Li.
© 2024.
34 pages.
|
Amit Singh, Jay Prakash, Gaurav Kumar, Praphula Kumar Jain, Loknath Sai Ambati.
© 2024.
25 pages.
|
Ruizhe Ma, Weiwei Zhou, Zongmin Ma.
© 2024.
21 pages.
|
|
|