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Applying Optoelectronic Devices Fusion in Machine Vision: Spatial Coordinate Measurement
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Author(s): Wendy Flores-Fuentes (Autonomous University of Baja California, Mexico), Moises Rivas-Lopez (Autonomous University of Baja California, Mexico), Daniel Hernandez-Balbuena (Autonomous University of Baja California, Mexico), Oleg Sergiyenko (Autonomous University of Baja California, Mexico), Julio C. Rodríguez-Quiñonez (Autonomous University of Baja California, Mexico), Javier Rivera-Castillo (Autonomous University of Baja California, Mexico), Lars Lindner (Autonomous University of Baja California, Mexico)and Luis C. Basaca-Preciado (Center of Excellence in Innovation & Design – CETYS University, Mexico)
Copyright: 2020
Pages: 30
Source title:
Natural Language Processing: Concepts, Methodologies, Tools, and Applications
Source Author(s)/Editor(s): Information Resources Management Association (USA)
DOI: 10.4018/978-1-7998-0951-7.ch010
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Abstract
Machine vision is supported and enhanced by optoelectronic devices, the output from a machine vision system is information about the content of the optoelectronic signal, it is the process whereby a machine, usually a digital computer and/or electronic hardware automatically processes an optoelectronic signal and reports what it means. Machine vision methods to provide spatial coordinates measurement has developed in a wide range of technologies for multiples fields of applications such as robot navigation, medical scanning, and structural monitoring. Each technology with specified properties that could be categorized as advantage and disadvantage according its utility to the application purpose. This chapter presents the application of optoelectronic devices fusion as the base for those systems with non-lineal behavior supported by artificial intelligence techniques, which require the use of information from various sensors for pattern recognition to produce an enhanced output.
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